DSD 2020

Dependability, Testing and Fault Tolerance in Digital Systems (DTFT)

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Special Session Scope

The Euromicro Conference on Digital System Design (DSD) addresses all aspects of (embedded, pervasive and high-performance) digital and mixed HW/SW system engineering, covering the whole design trajectory from system specification down to micro-architectures, digital circuits and VLSI implementations.

Every designed system has to be tested several times during its life-time - during its design, production, and its in-field operation. The need for testing strictly depends on the actual use of the system, if the system can be repaired or not, and on the requirements for the system, e.g., if the system must be dependable, fault tolerant, etc. The design must reflect these requirements. The special session on "Dependability, Testing, and Fault Tolerance in Digital Systems" (DTFT) addresses emerging issues, hot problems, new solution methods and their hardware and software implementations in all fields of digital and analog/mixed-signal system dependability and testing. It is especially focused on testing, dependability, and fault-tolerance of SoC based designs and modern embedded applications.

Papers on any of the following and related topics can be submitted to the special session:

• Diagnosis & testing of embedded systems, SoC and NoC testing
• Memory and CPU testing
• Analog, mixed-signal and RF, IDDQ and current testing
• Built-In Self-Test: off-line BIST and on-line BIST, test compression methods
• Testability analysis, design for testability
• Error detection and correction, on-line testing, design of checkers
• Design of dependable (robust) circuits and systems, error mitigation techniques
• Defect/fault tolerant architectures (SoCs, NoCs, embedded systems)
• FPGA based fault tolerant systems, partial/full reconfiguration based methods
• Fault injection techniques, fault simulation/emulation
• Dependability modeling, dependability analysis and validation
• Formal approaches in fault tolerant systems design
• System diagnosis
• Dependable design in practical applications

Special Session Chairs

P. Fišer (CTU in Prague, CZ)

Z. Kotásek (BUT in Brno, CZ)

Special Session Program Committee

P. Bernardi, Politecnico di Torino (IT)

Ch. Bolchini, Politechnico di Milano (IT)

A. Bosio, École Centrale Lyon (FR)

L. Cassano, Politechnico di Milano (IT)

G. Fey, Hamburg Univ. of Technology (DE)

T. Garbolino, Silesian TU, Gliwice (PL)

M. Jenihhin, TTU, Tallin (EE)

M. Keim, Mentor Graphics, Wilsonville (US)

A. Krasniewski, WUT, Warsaw (PL)

H. Kubátová, CTU in Prague (CZ)

I. Levin, Tel Aviv University (IL)

H. Manhaeve, Q-Star Test (BE)

A. McEwan, University of Leicester (UK)

L. Miclea, TU of Cluj-Napoca (RO)

A. Miele, Politecnico di Milano (IT)

G. Di Natale, TIMA, Grenoble (FR)

S. Racek, U. of West Bohemia (CZ)

R. Růžička, BUT, Brno (CZ)

T. Sasao, Meiji University, Kawasaki (JP)

T. Sato, Fukuoka University (JP)

M. Sonza Reorda, Politecnico di Torino (IT)

A. Steininger, Vienna U. of Techn. (AT)

R. Ubar, TTU, Tallinn (EE)

H. T. Vierhaus, Brandenburg U. Tech. (DE)